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FEI Introduces Nova NanoSEM New System is the World's First SEM for Ultra-High Resolution Characterization of Non-Conductive or Contaminating SamplesFEI Company released the newest member of its Nova(TM) family of SEM and DualBeam(TM) systems, the Nova NanoSEM. It is the world's first low-vacuum, field emission scanning electron microscope (FEG-SEM) solution for ultra-high resolution characterization of charging and/or contaminating samples such as organic materials, substrates, porous materials, plastics and polymers. This newest system joins FEI's growing line of market-leading tools that are enabling nanoscale research, development and manufacturing in a diverse range of markets and applications.
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