News
FEI’s AUTOMATED 3D CRYSTALLOGRAPHY FEATURED AT PITTCON FEI’s EBS3 Fully-Automated Electron Backscattered Diffraction Solution
Delivers Rapid Serial Sectioning and 3D Crystal Orientation
Reconstructions of Materials
HILLSBORO, Ore. /March 13, 2006--FEI Company (Nasdaq: FEIC) will feature its EBS3 DualBeam™ solution for rapid serial sectioning and 3D crystallographic reconstructions of materials at this week’s Pittcon conference in Orlando.
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