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Hyphenated Systems and UMass Dartmouth ATMC Announce JDP

Hyphenated-Systems’ 3Dmap to Provide Sub-Surface 3D Structure Characterization and Flow Analysis of Advanced Microfluidic Devices at UMass ATMC Facility Burlingame, CA, January 31, 2006―Hyphenated-Systems, a world-wide provider of hybrid microscopy solutions for three-dimensional (3D) imaging and metrology in micro- and nanotechnology, announces a joint development project (JDP) with the Advanced Technology and Manufacturing Center (ATMC) at the University