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CCHAR High-aspect Ratio CNT Probes for Atomic Force Microscopy (AFM)

The CCHAR high-aspect ratio CNT AFM probe, are designed for critical dimension measurements and imaging high-Z structures in materials science, metrology and life science applications.

• http://feedproxy.google.com/~r/PhysicsWorldProducts/~3/OKRg4N8LU1A/P000012366