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NANOSENSORSâ„¢ announces new high-Q AFM probe

NANOSENSORS™ today announced the Q30K-Plus, a novel scanning proximity probe with a very high Q-factor and an enhanced signal to noise ratio for UHV applications. Based on the well-known PointProbe® Plus AFM probe NANOSENSORS™ has developed the Q30K-Plus SPM-probe series especially for UHV applications.