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Fei Introduces Hardware And Software Upgrades For Tecnaiâ„¢ G2 Tem EINDHOVEN, August 4, 2005 -- FEI Company released new software and hardware for its market-leading Tecnai(â„¢) G2 transmission electron microscope (TEM) at Microscopy and Microanalysis 2005 Conference in Honolulu. The new software (Tecnai 3.0) delivers enhanced ease of operation of the Tecnai TEM and ensures full benefit of the system's leading- edge performance.
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