News
k-Space introduces novel temperature monitor for GaN and SiC growth k-Space Associates, Inc. has announced that it has developed the kSA GaN BandiT, a new optical temperature monitoring system which directly measures the temperature of GaN and SiC-based films commonly grown by MOCVD or MBE.
All current forms of GaN/SiC temperature measurement, including emissivity-corrected pyrometers (ECP’s), rely upon technology that only measures black body radiation from the susceptor or heater behind the sample.
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