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Temperature Control Improves NIST X-ray Detector Researchers at the National Institute of Standards and Technology (NIST) have developed an improved experimental X-ray detector that could pave the way to a new generation of wide-range, high-resolution trace chemical analysis instruments. In a recently published technical paper*, the researchers described how they used improved temperature-sensing and control systems to detect X-rays across a very broad range of energies (6 keV or more), with pinpoint energy resolution (an uncertainty of only 2 eV).
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