News
Laser Atom Probe Leads The Way To Seeing Atomic-Level Silicon Structures Atom by atom analysis of semiconductor materials has just become a reality with the announcement from Oxford nanoScience Ltd that its Advanced Laser 3 Dimensional Atom Probe (3DAP) technology can now be used on silicon devices.
For the first time semiconductor device manufacturers will be able to determine both the elemental identity and position of individual atoms in their products.
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