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Making microscopes go faster Scientists in the US and Israel have demonstrated an atomic force microscope that can take images of periodic processes with a time resolution of microseconds. This is an order of magnitude faster than is possible with conventional "rapid-scan" (M Anwar and I Rousso 2005 Appl. Phys. Lett 86 014101). An atomic force microscope (AFM) works by measuring how the force between the sample and a tiny "tip" on a cantilever changes as the microscope is moved over the surface of the sample.
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