News
New – Hiden ‘MAXIM’ SIMS detector The Hiden Analytical UHV surface analysis system range is further extended by the addition of ‘MAXIM’, a high-performance quadrupole secondary ion monitor specifically designed for optimum sensitivity for surface analysis and depth profiling applications for a wide range of materials including polymers, superconductors, semiconductors, alloys and dielectric, with measurement of trace components to sub-ppm levels.
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