News
New technique provides defect selective recognition of material failure CEDIP Infrared Systems, specialists in thermal IR technology, have released a new technical paper that describes a new technique that provides defect selective recognition of material failure.
Ultrasound Excited Thermography is a new non-destructive testing / non-destructive examination technology developed and patented in a cooperative venture with IKP (University of Stuttgart) and Enhanced Defect Visualisation GmbH.
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